High-Temperature Gate Capacitances of Thin-Film SOI MOSFETs.
Autor: | Gentinne, B., Flandre, D., Colinge, J.-P., Van de Wiele, F. |
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Zdroj: | ESSDERC '93: 23rd European solid State Device Research Conference; 1993, p687-690, 4p |
Databáze: | Complementary Index |
Externí odkaz: |