High-Temperature Gate Capacitances of Thin-Film SOI MOSFETs.

Autor: Gentinne, B., Flandre, D., Colinge, J.-P., Van de Wiele, F.
Zdroj: ESSDERC '93: 23rd European solid State Device Research Conference; 1993, p687-690, 4p
Databáze: Complementary Index