A Study of the Dielectric Breakdown of Thermally Grown SiO2 by the Self-Quenching Technique.
| Autor: | Yang, D. Y., Johnson, Walter C., Lampert, Murray A. |
|---|---|
| Zdroj: | 13th International Reliability Physics Symposium; 1975, p10-14, 5p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|