Impact of the minority carrier outflow (MCO) effect on the /spl alpha/-particle-induced soft error of scaled DRAMs.
| Autor: | Oowaki, Y., Mabuchi, K., Hasegawa, T., Manabe, S., Watanabe, S., Ohuchi, K., Masuoka, F. |
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| Zdroj: | Proceedings of 1994 IEEE International Electron Devices Meeting; 1994, p627-630, 4p |
| Databáze: | Complementary Index |
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