Charging protection and degradation by antenna environment on NMOS and PMOS transistors.
| Autor: | Carrere, J.-P., Heslinga, D.R. |
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| Zdroj: | 1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat No99TH8395); 1999, p184-187, 4p |
| Databáze: | Complementary Index |
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