High resolution Magnetic Current Imaging for die level short localization.
| Autor: | Gaudestad, J., Gagliolo, N., Talanov, V. V., Yeh, R. H., Ma, C. J. |
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| Zdroj: | Proceedings of the 20th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA); 2013, p347-350, 4p |
| Databáze: | Complementary Index |
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