Auger electron spectroscopy from elemental standards. III. Backgrounds and peak-to-background ratios.

Autor: Batchelor, D. R., Bishop, H. E., Venables, J. A.
Zdroj: Surface & Interface Analysis: SIA; 1989, Vol. 14 Issue 11, p709-716, 8p
Databáze: Complementary Index
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