X-ray Wide-Band and Time-Resolved Imaging and Spectroscopic Characterization of Hot Spots and Jets in 0.9–1.0 MA X-pinches.

Autor: Kantsyrev, Victor L., Fedin, Dmitry A., Shlyaptseva, Alla S., Hansen, Stephanie B., Ouart, Nicholas D.
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Zdroj: AIP Conference Proceedings; 2002, Vol. 651 Issue 1, p181, 4p
Abstrakt: The new results of time-resolved x-ray imaging and spectroscopic study of the development of jets and hot spots in 0.9-1.0 MA x-pinches during the rise of the current are presented. The results of x-pinch radiation properties studies and possible applications of such an x-ray source in a surface physics and backlighting are reported. Experiments were performed with the NTF "Zebra" machine with a peak current of about 1.2 MA, a rise time of 100 ns, a maximum stored energy of 200 kJ, and 1.9 Ω pulse-forming line impedance. X-ray diagnostics include 12 x-ray/EUV devices: x-ray time- and spatial-resolved or time-integrated spectrometers, time-resolved and time-integrated x-ray imaging devices, x-ray polarimeters/spectrometers, fast x-ray and hard x-ray detectors. X-pinch planarloop and wire twisted configurations were used. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index