Semiconductor laser analysis: general method for characterising devices of various cross-sectional geometries.
| Autor: | Shore, K.A., Rozzi, T.E., In't Veld, G.H. |
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| Zdroj: | IEE Proceedings: Part I: Solid-State & Electron Devices; Oct1980, Vol. 127 Issue 5, p221-229, 9p |
| Databáze: | Complementary Index |
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