Measurement of history effect in PD/SOI single-ended CPL circuit.
| Autor: | Jenkins, K.A., Puri, R., Chuang, C.T., Pesavento, F.L. |
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| Zdroj: | 2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207); 2001, p57-58, 2p |
| Databáze: | Complementary Index |
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