A high performance 90nm SOI technology with 0.992 μm2 6T-SRAM cell.

Autor: Khare, M., Ku, S.H., Donaton, R.A., Greco, S., Brodsky, C., Chen, X., Chou, A., DellaGuardia, R., Deshpande, S., Doris, B., Fung, S.K.H., Gabor, A., Gribelyuk, M., Holmes, S., Jamin, F.F., Lai, W.L., Lee, W.H., Li, Y., McFarland, P., Mo, R.
Zdroj: Digest. International Electron Devices Meeting; 2002, p407-410, 4p
Databáze: Complementary Index