Predicting Pixel Defect Rates Based on Image Sensor Parameters.
| Autor: | Chapman, G.H., Leung, J., Namburete, A., Koren, I., Koren, Z. |
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| Zdroj: | 2011 IEEE International Symposium on Defect & Fault Tolerance in VLSI & Nanotechnology Systems (DFT); 2011, p408-416, 9p |
| Databáze: | Complementary Index |
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