Studying the impact of gate tunneling on dynamic behaviors of partially-depleted SOI CMOS using BSIMPD.
| Autor: | Pin Su, Fung, S.K.H., Weidong Liu, Chenming Hu |
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| Zdroj: | Proceedings International Symposium on Quality Electronic Design; 2002, p487-491, 5p |
| Databáze: | Complementary Index |
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