Impact of mechanical stress engineering on flicker noise characteristics.
| Autor: | Maeda, S., You-Seung Jin, Jung-A Choi, Sun-Young Oh, Hyun-Woo Lee, Jae-Yoon Yoo, Min-Chul Sun, Ja-Hum Ku, Kwon Lee, Su-Gon Bae, Sung-Gun Kang, Jeong-Hwan Yang, Young-Wug Kim, Kwang-Pyuk Suh |
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| Zdroj: | 2004 Digest of Technical Papers. 2004 Symposium on VLSI Technology; 2004, p102-103, 2p |
| Databáze: | Complementary Index |
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