Efficient High-Speed Interface Verification and Fault Analysis.

Autor: Nirmaier, T., Zaguirre, J.T., Hong, E., Spirkl, W., Rettenberger, A., Schmitt-Landsiedel, D.
Zdroj: 2008 IEEE International Test Conference; 2008, p1-9, 9p
Databáze: Complementary Index