ESD protection for sub-45 nm MugFET technology.
| Autor: | Natarajan, M.I., Thijs, S., Tremouilles, D., Linten, D., Collaert, N., Jurczak, M., Groeseneken, G. |
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| Zdroj: | 2007 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2007, p159-164, 6p |
| Databáze: | Complementary Index |
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