DC-Coupled Laser Induced Detection System for Fault Localization in Microelectronic Failure Analysis.
| Autor: | Quah, A.C.T., Koh, L.S., Chua, C.M., Palaniappan, M., Chin, J.M., Phang, J.C.H. |
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| Zdroj: | 2006 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2006, p327-332, 6p |
| Databáze: | Complementary Index |
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