A Study of Asymmetrical Behaviour in Advanced Nano SRAM Devices.
Autor: | Hung-Sung Lin, Wen-Tung Chang, Chun-Lin Chen, Tsui-Hua Huang, Vivian Chiang, Chun-Ming Chen |
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Zdroj: | 2006 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2006, p63-66, 4p |
Databáze: | Complementary Index |
Externí odkaz: |