A Study of Asymmetrical Behaviour in Advanced Nano SRAM Devices.

Autor: Hung-Sung Lin, Wen-Tung Chang, Chun-Lin Chen, Tsui-Hua Huang, Vivian Chiang, Chun-Ming Chen
Zdroj: 2006 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2006, p63-66, 4p
Databáze: Complementary Index