Leakage issues in failure analysis of p+ SiGe active area short monitor.
| Autor: | Arya, A., Johnson, G.M., Ronsheim, P., Nxumalo, J., Molella, C.M., Murphy, R.J., Seung Chul Lee, Daleo, C., Bum Ki Moon, Onoda, H., Chung Woh Lai, Shenzhi Yang, Chow, Y.T.C., Lee, J. |
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| Zdroj: | 2011 18th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA); 2011, p1-4, 4p |
| Databáze: | Complementary Index |
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