System-level characterization of bias noise effects on electrostatic RF MEMS tunable filters.
| Autor: | Xiaoguang Liu, Kenle Chen, Katehi, L.P.B., Chappell, W.J., Peroulis, D. |
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| Zdroj: | 2011 IEEE 24th International Conference on Micro Electro Mechanical Systems (MEMS); 2011, p797-800, 4p |
| Databáze: | Complementary Index |
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