Exploiting Network-on-Chip structural redundancy for a cooperative and scalable built-in self-test architecture.
| Autor: | Strano, A., Go?mez, C., Ludovici, D., Favalli, M., Go?mez, M.E., Bertozzi, D. |
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| Zdroj: | 2011 Design, Automation & Test in Europe Conference & Exhibition (DATE); 2011, p1-6, 6p |
| Databáze: | Complementary Index |
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