| Autor: |
Smirl, Arthur L., Boyd, Ian W., Boggess, Thomas F., Moss, Steven C., van Driel, Henry M. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 8/1/1986, Vol. 60 Issue 3, p1169, 14p, 18 Black and White Photographs |
| Abstrakt: |
Focuses on a study which examined the bulk and surface structural changes in silicon following melting with laser pulses using Nomarski and transmission electron microscope techniques. Experimental details; Surface morphology; Cross-sectional microstructure; Summary and discussion. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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