Critical current density and resistivity measurements for long patterned lines in Tl2Ba2CaCu2O8 thin films.

Autor: Holstein, W. L., Wilker, C., Laubacher, D. B., Face, D. W., Pang, P., Warrington, M. S., Carter, C. F., Parisi, L. A.
Předmět:
Zdroj: Journal of Applied Physics; 7/15/1993, Vol. 74 Issue 2, p1426, 5p, 3 Black and White Photographs, 2 Charts, 4 Graphs
Abstrakt: Focuses on a study which prepared epitaxial Tl[sub2]Ba[sub2]CaCu[sub2]O[sub8] thin films on LaAlO[sub3] through a two-step post-deposition thallination process. Experimental details; Results; Discussion.
Databáze: Complementary Index