Autor: |
Giles, N. C., Hwang, S., Schetzina, J. F., McDevitt, S., Johnson, C. J. |
Předmět: |
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Zdroj: |
Journal of Applied Physics; 9/1/1988, Vol. 64 Issue 5, p2656, 10p, 1 Diagram, 1 Chart, 10 Graphs |
Abstrakt: |
Presents a study which examined the effects of a high-temperature anneal on the electrical and optical properties of bulk CdTe:In. Resistivity of bulk CdTe:In samples; Correlation between the electrical and optical properties of bulk CdTe:In; Factors which made it possible to control the electrical properties of CdTe thin films. |
Databáze: |
Complementary Index |
Externí odkaz: |
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