Multiple-pass writing optimization for proximity x-ray mask-making using electron-beam lithography.

Autor: Puisto, Denise M., Lawliss, Mark S., Rocque, Janet M., Kimmel, Kurt R., Hartley, John G.
Zdroj: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1996, Vol. 14 Issue 6, p4341-4344, 4p
Databáze: Complementary Index