Multiple-pass writing optimization for proximity x-ray mask-making using electron-beam lithography.
Autor: | Puisto, Denise M., Lawliss, Mark S., Rocque, Janet M., Kimmel, Kurt R., Hartley, John G. |
---|---|
Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1996, Vol. 14 Issue 6, p4341-4344, 4p |
Databáze: | Complementary Index |
Externí odkaz: |