High-speed, large-scale imaging with the atomic force microscope.
| Autor: | Barrett, R. C., Quate, C. F. |
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| Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1991, Vol. 9 Issue 2, p302-306, 5p |
| Databáze: | Complementary Index |
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