Ellipsomicroscopy for surface imaging: A novel tool to investigate surface dynamics.
| Autor: | Haas, G., Pletcher, T. D., Bonilla, G., Jachimowski, T. A., Rotermund, H. H., Lauterbach, J. |
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| Zdroj: | Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1998, Vol. 16 Issue 3, p1117-1121, 5p |
| Databáze: | Complementary Index |
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