Application of x-ray topographic methods to thin film electronic materials.
| Autor: | Weissmann, Sigmund |
|---|---|
| Zdroj: | Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1986, Vol. 4 Issue 6, p1467-1471, 5p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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