A New X-Ray Diffraction Method for Studying Imperfections of Crystal Structure in Polycrystalline Specimens.
| Autor: | Reis, Alfred J., Slade, Jerome J., Weissmann, Sigmund |
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| Zdroj: | Journal of Applied Physics; May1951, Vol. 22 Issue 5, p665-672, 8p |
| Databáze: | Complementary Index |
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