Structural characterization of low-defect-density silicon on sapphire.
| Autor: | Carey, Kent W., Ponce, Fernando A., Amano, Jun, Aranovich, Julio |
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| Zdroj: | Journal of Applied Physics; Aug1983, Vol. 54 Issue 8, p4414-4420, 7p |
| Databáze: | Complementary Index |
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