Strain profiles in ion-implanted bubble devices investigated by transmission electron diffraction.
| Autor: | Omi, T., Bauer, C. L., Kryder, M. H. |
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| Zdroj: | Journal of Applied Physics; Mar1982, Vol. 53 Issue 3, p2528-2530, 3p |
| Databáze: | Complementary Index |
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