Characterization of structural defects in annealed silicon containing oxygen.
| Autor: | Maher, D. M., Staudinger, A., Patel, J. R. |
|---|---|
| Zdroj: | Journal of Applied Physics; Sep1976, Vol. 47 Issue 9, p3813-3825, 13p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Maher, D. M., Staudinger, A., Patel, J. R. |
|---|---|
| Zdroj: | Journal of Applied Physics; Sep1976, Vol. 47 Issue 9, p3813-3825, 13p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|