Photoexcited hot electron relaxation processes in n-HgCdTe through impact ionization into traps.

Autor: Seiler, D. G., Lowney, J. R., Littler, C. L., Yoon, I. T., Loloee, M. R.
Zdroj: AIP Conference Proceedings; Oct1991, Vol. 235 Issue 1, p1847-1851, 5p
Databáze: Complementary Index