Enhanced layout optimization of sub-45nm standard: memory cells and its effects.
| Autor: | Paek, Seung Weon, Jang, Dae Hyun, Park, Joo Hyun, Ha, Naya, Kim, Byung-Moo, Won, Hyo Sig, Choi, Kyu-Myung, Lin, Kuang-Kuo, Klaver, Simon, Malik, Shobhit, Oostindie, Michiel, Driessen, Frank |
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| Zdroj: | Proceedings of SPIE; Nov2009 Part 2, Issue 1, p72751M-72751M-9, 9p |
| Databáze: | Complementary Index |
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