SIM instrument integration and test challenges: PKT & FAST testbed influence.
| Autor: | Drosdat, Helmuth, Duncan, Alan L. |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov2003, Issue 1, p326-335, 10p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Drosdat, Helmuth, Duncan, Alan L. |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov2003, Issue 1, p326-335, 10p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|