Comparative investigations of the bolometric properties of thin film structures based on vanadium dioxide and amorphous hydrated silicon.

Autor: Malyarov, V. G., Khrebtov, Igor A., Kulikov, Yu. V., Shaganov, Igor I., Zerov, V. Y., Feoktistov, Nikolai A.
Zdroj: Proceedings of SPIE; Nov1999, Issue 1, p136-142, 7p
Databáze: Complementary Index