Chemically amplified positive resist for next-generation photomask fabrication.

Autor: Katoh, Kohji, Kasuya, Kei, Arai, Tadashi, Sakamizu, Toshio, Satoh, Hidetoshi, Saitoh, Hidetaka, Hoga, Morihisa
Zdroj: Proceedings of SPIE; Nov1999, Issue 1, p577-586, 10p
Databáze: Complementary Index