Innovating SRAM design and test program for fast process-related defect recognition and failure analysis.
| Autor: | Coppens, Peter, Vanhorebeek, Guido, De Backer, Eddy, Yuan, Xiao J. |
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| Zdroj: | Proceedings of SPIE; Nov1999, Issue 1, p290-297, 8p |
| Databáze: | Complementary Index |
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