Ion-beam-induced amorphization and recrystallization processes in SiC: Raman-scattering analysis.
| Autor: | Perez-Rodriguez, Alejandro, Serre, Christoph, Calvo-Barrio, L., Romano-Rodriguez, A., Morante, Juan R., Pacaud, Y., Koegler, R., Skorupa, Wolfgang |
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| Zdroj: | Proceedings of SPIE; Nov1995, Issue 1, p481-494, 14p |
| Databáze: | Complementary Index |
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