Improvement of the resolution and accuracy of chemical-amplification positive resist for 0.13-m reticle fabrication.

Autor: Arai, Tadashi, Sakamizu, Toshio, Kasuya, Kei, Katoh, Kohji, Soga, Takashi, Saitoh, Hidetaka, Shiraishi, Hiroshi, Hoga, Morihisa
Zdroj: Proceedings of SPIE; Nov2000 Part 2, Issue 1, p281-288, 8p
Databáze: Complementary Index