Structural characteristics and performances of rf-sputtered Mo/Si and Co/Si multilayers for soft x-ray optics.

Autor: Boher, Pierre, Houdy, Philippe, Hennet, Louis, Kuehne, Mikhael, Mueller, Peter, Frontier, J. P., Trouslard, P., Senillou, C., Joud, J. C., Ruterana, P.
Zdroj: Proceedings of SPIE; Nov1992, Issue 1, p21-38, 18p
Databáze: Complementary Index