SPICE Level 3 and BSIM3v3.1 characterization of monolithic integrated CMOS-MEMS devices.

Autor: Staple, Bevan D., Watts, Herman A., Dyck, Christopher W., Griego, A. P., Hewlett, F. W., Smith, James H.
Zdroj: Proceedings of SPIE; Nov1998 Part 2, Issue 1, p410-420, 11p
Databáze: Complementary Index