| Autor: |
Jampatong, Chaba, McMullen, Michael D., Barry, B. Dean, Darrah, Larry L., Byrne, Patrick F., Kross, Heike |
| Předmět: |
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| Zdroj: |
Crop Science; Mar/Apr2002, Vol. 42 Issue 2, p584, 10p, 2 Diagrams, 4 Charts, 2 Graphs |
| Abstrakt: |
Examines the genetic effects of quantitative trait loci (QTL) conferring resistance to leaf feeding damage caused by first generation European corn borer (ECB) in U.S. Importance of understanding the genetic basis for ECB resistance; Goals of QTL mapping; Sensitivity of QTL to environmental changes. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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