New Materials in Memory Development Sub 50 nm: Trends in Flash and DRAM.

Autor: Kuesters, Karl Heinz, Beug, Marc Florian, Schroeder, Uwe, Nagel, Nicolas, Bewersdorff, Ulrike, Dallmann, Gerald, Jakschik, Stefan, Knoefler, Roman, Kudelka, Stephan, Ludwig, Christoph, Manger, Dirk, Mueller, Wolfgang, Tilke, Armin
Zdroj: Advanced Engineering Materials; Apr2009, Vol. 11 Issue 4, p241-248, 8p
Databáze: Complementary Index
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