X-ray fluorescence analysis by the fundamental parameters method without explicit knowledge of the excitation beam spectrum.

Autor: Martínez, V. Delgado, Hidalgo, C. Martínez, Barrea, R. A.
Zdroj: XRS: X-ray Spectrometry; May2000, Vol. 29 Issue 3, p245-248, 4p
Databáze: Complementary Index