Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer.

Autor: Bichlmeier, S., Janssens, K., Heckel, J., Hoffmann, P., Ortner, H. M.
Zdroj: XRS: X-ray Spectrometry; Jan2002, Vol. 31 Issue 1, p87-91, 5p
Databáze: Complementary Index
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