| Autor: |
Haran, Avner, Barak, Joseph, Weissman, Leo, Keren, Eitan |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Nuclear Science; Jun2011 Part 2, Vol. 58 Issue 3, p848-854, 7p |
| Abstrakt: |
An analytical model is developed to calculate neutron-induced SEU cross section in deep submicron devices from heavy ion SEU cross section. It is based on the energy spectra of the secondaries of n +Si nuclear reactions which yields the LET distribution of all secondary ions. The integration of this distribution function with the measured heavy ion cross section vs. LET yields the n-SEU cross section. To make the calculations straight forward, the neutron-induced LET distribution is fitted by simple functions. The model is applied to SEU from 14 MeV neutrons and compared with experimental results. Its relevance to proton-induced SEU is discussed. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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