Detecting efficiency-limiting defects in Czochralski-grown silicon wafers in solar cell production using photoluminescence imaging.

Autor: Haunschild, Jonas, Reis, Isolde E., Geilker, Juliane, Rein, Stefan
Zdroj: Physica Status Solidi - Rapid Research Letters; Jun2011, Vol. 5 Issue 5/6, p199-201, 3p
Databáze: Complementary Index
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