| Autor: |
Marty, A., Samson, Y., Gilles, B., Belakhovsky, M., Dudzik, E., Du¨rr, H., Dhesi, S. S., van der Laan, G., Goedkoop, J. B. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 5/1/2000, Vol. 87 Issue 9, p5472, 3p |
| Abstrakt: |
The magnetic domain structure in thin ferromagnetic films with perpendicular anisotropy is investigated. The effect of an in-plane magnetic field on the presence of domains and the magnetization profile is analyzed within the framework of a one-dimensional analytical model. The general results are reported in a state diagram as a function of the two relevant dimensionless parameters: the quality factor and the ratio of the film thickness to the exchange length. The experimental results, including hysteresis measurements, magnetic force microscopy, and x-ray resonant magnetic scattering obtained on a generic FePd thin layer, are reported and compared to the model. © 2000 American Institute of Physics. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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