| Autor: |
Young, D. K., Mack, M. P., Abare, A.C., Hansen, M., Coldren, L.A. |
| Předmět: |
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| Zdroj: |
Applied Physics Letters; 4/19/1999, Vol. 74 Issue 16, p2349, 3p, 6 Black and White Photographs, 1 Diagram, 2 Graphs |
| Abstrakt: |
Investigates the near-field scanning optical microscopy of indium gallium nitride multiple-quantum-well laser diodes. Imaging of facet cross sections; Observation of spatially resolved spectra near the active region; Observation of single-mode emission. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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